The target region focused imaging method for scanning ion conductance microscopy
Published in Ultramicroscopy, 2023
Scanning ion conductance microscopy (SICM) has developed rapidly and has wide applications in biomedicine, single-cell science and other fields. SICM scanning speed is limited by the conventional raster-type scanning method, which spends most of time on imaging the substrate and does not focus enough on the target area. In order to solve this problem, a target region focused (TRF) method is proposed, which can effectively avoid the scanning of unnecessary substrate areas and enables SICM to image the target area only to achieve high-speed and effective local scanning. TRF method and conventional hopping mode scanning method are compared in the experiments using breast cancer cells and rat basophilic leukaemia cells as experimental materials.
Recommended citation: Gu, S., Zhuang, J., Wang, T., Hu, S., Song, W., & Liao, X. (2023). The target region focused imaging method for scanning ion conductance microscopy. Ultramicroscopy, 113910.