Tianying Wang（王天颖）

Tianying Wang（王天颖）

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500kHz Bandwidth Feedback for Scanning Ion Conductance Microscopy With Nano-Resolution

Published in IEEE Transactions on Industrial Electronics, 2023

Scanning ion conductance microscopy (SICM) has been developing rapidly and has been a versatile tool for nanoscale imaging. However, the imaging quality and scanning speed of SICM have been significant restriction factors for its various applications. One of the main reasons is the mutual restriction of bandwidth and noise of the ion current feedback. In this paper, a low-noise two-stage transimpedance amplifier (TIA) with 500 kHz bandwidth was proposed and a low-capacitance pipette was combined to depress the high-frequency ion current noise of SICM’s feedback circuit. The effect of pipette capacitance, which is a major cuase of high-frequency noise, was significantly reduced by covering a thin polydimethylsiloxane (PDMS) film on the outer wall of the pipette. Finite element method (FEM) was employed for the first time to simulate the pipette capacitance model.

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Recommended citation: Cheng, L., Zhuang, J., Wang, T., Liao, X., & Yu, J. (2023). 500kHz Bandwidth Feedback for Scanning Ion Conductance Microscopy With Nano-Resolution. IEEE Transactions on Industrial Electronics.